Shopping cart is empty.

MEMS And Sensors Reliability

Veryst Engineering provides world leading expertise in MEMS and Sensors reliability. Veryst possesses a cumulative industry experience exceeding 50 years in the fields of yield, reliability, and failure analysis, with more than 25 of those years in the MEMS and Sensors world.

       MEMS Polysilicon Oscillator Structure         

MEMS Polysilicon Oscillator Structure

Veryst Engineering consultants include world-recognized experts in MEMS and Sensors reliability with more than 25 years’ industry experience in the reliability of MEMS products in various use environments, including stringent automotive safety, space environments, consumer electronics, and games. Ms. Allyson Hartzell is a co-author of the book MEMS Reliability of the MEMS Reference Shelf from Springer Science and Business Media. Prior to her years in the MEMS world, she worked 15 years in semiconductor reliability developing a strong base in yield, failure analysis, and reliability. Veryst consultants include additional experts in MEMS and Sensors simulation, reliability, and testing.

Veryst’s experience with different MEMS and Sensors products includes but is not limited to: accelerometers, tilt sensors, gyroscopes, micro-mirrors, microphones, micro solid oxide fuel cells, switches, display technology, piezoelectric devices, and medical devices. New MEMS and Sensors technologies are being developed daily, and reliability is key to acceptance in the marketplace. Proper methodologies for testing and evaluation are essential to predicting MEMS and Sensors product lifetimes, playing a role in all stages of commercialization from the engineering design phase all the way to product release.

1-micrometer resonator altered by molecular layer of water

Natural frequency of 1-micrometer resonator can be altered by molecular layer of water

Areas of MEMS consulting include:

  • Lifetime prediction, long term reliability testing, and acceleration factors

  • Reliability test planning

  • Failure analysis to determine physics of failure in yield and reliability

  • Micro-contamination (both molecular and particulate)

  • Manufacturing environment (cleanroom expertise and audits)

  • Package and solder reliability 

  • Simulation of MEMS and Sensors devices and operation

    • Stiction, creep, fatigue, lubrication, thermal stresses

    • Design optimization for manufacturing and reliability

    • Microfluidics

Veryst provides experience with advanced analytical techniques including:

  • SEM (Scanning Electron Microscopy)
  • EDS (Energy-Dispersive X-Ray Analysis)
  • WDS (Wavelength Dispersive X-Ray Analysis)
  • TEM (Transmission Electron Microscopy)
  • AFM (Atomic Force Microscopy)
  • Auger Analysis, XPS (X-Ray Photoelectron Spectroscopy)
  • FTIR (Fourier Transform Infrared Spectroscopy)
  • Ion Chromatography
  • Gas Chromatography/Mass Spectroscopy
  • Confocal Microscopy
  • Digital Holographic Microscopy
  • Scanning Vibrometry and Interferometry
Call Us

To contact Veryst, please call: