Tutorial program in MEMS reliability at IIRW

October 9, 2016
Fallen Leaf Lake, California

MEMS expert Allyson Hartzell presented a Tutorial Program at the IIRW (International Integrated Reliability Workshop) which took place in Fallen Leaf Lake, California on October 9-13, 2016.  The tutorial covered common failure mechanisms in MEMS and examples of design and process fixes.  Ms. Hartzell also addressed lifetime predictive methodologies, acceleration factor development, statistical distributions of reliability data, and case studies of non-standard MEMS reliability predictions.  Simulation of MEMS, packaging, and systems were also included. 

The tutorial provided guidance to the MEMS user and/or designer, with advice on how to fix problems before they happen as well as how to fit data properly.  Learn more about this event.

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