MEMS expert Allyson Hartzell presented a Tutorial Program at the IIRW (International Integrated Reliability Workshop) which took place in Fallen Leaf Lake, California on October 9-13, 2016. The tutorial covered common failure mechanisms in MEMS and examples of design and process fixes. Ms. Hartzell also addressed lifetime predictive methodologies, acceleration factor development, statistical distributions of reliability data, and case studies of non-standard MEMS reliability predictions. Simulation of MEMS, packaging, and systems were also included.
Tutorial program in MEMS reliability at IIRW
October 9, 2016
Fallen Leaf Lake, California