Allyson Hartzell was invited to speak at MEMS Testing and Reliability 2017: Annual Workshop and Exhibition, which took place on August 1, 2017 in Santa Clara, CA. Ms. Hartzell discussed MEMS Reliability: Brief History, Current Status, and Emerging Trends. The use of MEMS is expected to increase in record numbers with growing applications in wearables, consumer electronics, the Internet of Things, and more. This increase in use brings a demand for the best and most timely reliability techniques for evaluation to ensure excellent field performance. Ms. Hartzell’s presentation reviewed the newest evaluation methods, the pros and cons of long term reliability testing, emerging trends, and system-level reliability and design-in features for MEMS lifetime and data security. Learn about the event and about Ms. Hartzell’s presentation.
August 1, 2017
Santa Clara, California