Stiction Analysis
Service
MEMS & Sensors Reliability
Veryst assists clients with MEMS and sensors consulting through failure analysis, reliability, lifetime prediction, yield enhancement, micro-contamination analysis, and microfluidics and multiphysics simulations. We provide a synergistic approach of combining analytical characterization, empirical studies, and simulation. Veryst scientists are well versed in packaging reliability as well.MEMS, Sensors, & Microelectronics Failure Analysis
Veryst offers expertise in a full range of analytical tools and techniques for non-destructive and destructive failure analysis. Choosing the right analytical method is critical for determining the root cause of a failure. Some of the non-destructive methods we use begin with high magnification